17 results
Analysis and Artifacts in EELS Spectrum Imaging
-
- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 782-783
- Print publication:
- July 2011
-
- Article
-
- You have access
- Export citation
Charge Transfer at La1-xSrxMnO3 / SrTiO3 Interfaces Probed by Spectroscopic Imaging in an Aberration-Corrected STEM
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1398-1399
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
Fast Electron Beam Switching in Dielectric Samples
-
- Journal:
- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 264-265
- Print publication:
- July 2010
-
- Article
-
- You have access
- Export citation
SEM Contrast of Semi-insulating Compound Materials
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1106-1107
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
EFTEM, EELS, and Cathodoluminescence in Si-implanted SiO2 Layers
-
- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1104-1105
- Print publication:
- July 2009
-
- Article
-
- You have access
- Export citation
Cathodoluminescence of Ion-Implanted Silica Layers
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 328-329
- Print publication:
- September 2007
-
- Article
- Export citation
Non-conductive sample charging in SEM and ESEM
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S03 / September 2007
- Published online by Cambridge University Press:
- 07 September 2007, pp. 76-77
- Print publication:
- September 2007
-
- Article
- Export citation
Cathodoluminescence of Defects, Interstitial Molecules, and Clusters in Silica
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1378-1379
- Print publication:
- August 2007
-
- Article
- Export citation
Non-Conductive Specimens and Prevention of Electron Beam Charging
-
- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1476-1477
- Print publication:
- August 2007
-
- Article
- Export citation
Cathodoluminescence of Ge- Clusters in Silica Layers
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1532-1533
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation
Selfconsistent Electron Beam Charging of Non-Conductive Specimen in SEM and ESEM
-
- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1450-1451
- Print publication:
- August 2006
-
- Article
-
- You have access
- Export citation
Contributors
-
-
- Book:
- The Cambridge Handbook of Personal Relationships
- Published online:
- 05 June 2012
- Print publication:
- 05 June 2006, pp xvii-xxii
-
- Chapter
- Export citation
Monte Carlo Modeling of Electron Scattering in Nonconductive Specimens
-
- Journal:
- Microscopy and Microanalysis / Volume 10 / Issue 6 / December 2004
- Published online by Cambridge University Press:
- 01 December 2004, pp. 764-770
- Print publication:
- December 2004
-
- Article
- Export citation
Low Energy Electron Scattering and Electrical Charging in Non-conductive Specimen
-
- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 102-103
- Print publication:
- September 2003
-
- Article
- Export citation
EDX and Cathodoluminecence Depth Analysis in Ion-implanted SiO2 Layers
-
- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 104-105
- Print publication:
- September 2003
-
- Article
- Export citation
Electron Beam Induced Defects in SiO2
-
- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 360-361
- Print publication:
- September 2003
-
- Article
- Export citation
Cathodoluminescence of Quartz, Silica and Thin Amorphous SiO2 Layers
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 560 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 245
- Print publication:
- 1999
-
- Article
- Export citation